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SFP Laser Controller and
Diagnostic IC
Table 03h Register Descriptions
Table 03h, 80h to C7h: Temperature Lookup Table For DAC1
FACTORY DEFAULT:
MEMORY TYPE:
80h to C7h
bit7
00h
Nonvolatile (EEPROM)
EEPROM
bit0
This is the lookup table (LUT) for the DAC1 settings.
Table 04h In Default DS1852 Configuration, (Table 01h in DS1859 Configuration)
Register Descriptions
Table 04h (Table 01h in DS1859 Configuration), 80h: Mode
POWER-ON VALUE:
MEMORY TYPE:
0Bh
Volatile (SRAM)
80h
0
0
0
0
FT_enable
SEE
TEN
AEN
bit7
bit0
This byte controls the different modes of the DS1864. It controls the analog-to-digital updates, the shadowed EEPROM functionality
and the fast-trip comparators.
bit7:4
bit3
bit2
bit1
bit0
Value is 0.
FT_enable: Determines if the fast-trip comparators used to set fast-trip alarms are enabled or
disabled.
0 = Fast-trips are disabled.
1 = Fast-trips are enabled.
SEE : Determines if the Shadowed EEPROM acts like SRAM or EEPROM.
0 = Acts like EEPROM (Nonvolatile).
1 = Acts like SRAM (Volatile).
TEN: Determines if the temperature conversions are enabled or disabled.
0 = Temperature conversions disabled. DAC0 and DAC1 settings can be controlled manually by
writing to registers 82h and 83h in Table 04h (Table 01h in DS1859 configuration).
1 = Temperature conversions enabled. Lookup tables in automatic control mode. (default)
AEN: Determines if the address calculations from the LUT are enabled or disabled. This bit controls a
test mode setting that can allow manual control over the temperature index, Table 04h (Table 01h in
DS1859 configuration), Register 81h.
0 = Test mode. Manual control over Temperature Index enabled.
1 = Normal operation. Temperature index calculations automatically carried out.
Table 04h (Table 01h in DS1859 Configuration), 81h: Temperature Index Byte
FACTORY DEFAULT:
MEMORY TYPE:
00h until first temperature conversion.
Volatile (SRAM)
2
81h
7
2 6
2 5
2 4
2 3
2 2
2 1
2 0
bit7
This byte is the temperature calculated index used to select the address of DAC settings in the lookup tables.
bit0
46
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